Reflection electron microscopy of buried interfaces in the transmission geometrySPENCE, J. C. H.Ultramicroscopy. 1994, Vol 55, Num 3, pp 293-301, issn 0304-3991Article

The future of atomic resolution electron microscopy for materials scienceSPENCE, J. C. H.Materials science & engineering. R, Reports. 1999, Vol 26, Num 1-2, pp 1-49, issn 0927-796XArticle

On the accurate measurement of structure-factor amplitudes and phases by electron diffractionSPENCE, J. C. H.Acta crystallographica. Section A, Foundations of crystallography. 1993, Vol 49, pp 231-260, issn 0108-7673, 2Article

Surface imaging techniques and magnetic materialsSPENCE, J. C. H.Materials science & engineering. B, Solid-state materials for advanced technology. 1989, Vol 3, Num 4, pp 421-425, issn 0921-5107, 5 p.Article

Kink mechanism for formation of the Si(111)-(2 × 1) reconstructed surfaceSPENCE, J. C. H.Physical review. B, Condensed matter. 1988, Vol 38, Num 17, pp 12672-12674, issn 0163-1829Article

On the average Coulomb potential (Φ₀) and constraints on the electron density in crystalsO'KEEFFE, M; SPENCE, J. C. H.Acta crystallographica. Section A, Foundations of crystallography. 1994, Vol 50, pp 33-45, issn 0108-7673, 1Article

Observation of the graphite surface by reflection electron microscopy during STM operationSPENCE, J. C. H; LO, W; KUWABARA, M et al.Ultramicroscopy. 1990, Vol 33, Num 2, pp 69-82, issn 0304-3991, 14 p.Conference Paper

Channelling radiation in electron microscopySPENCE, J. C. H; HUMPHREYS, C. J.Optik (Stuttgart). 1984, Vol 66, Num 3, pp 225-242, issn 0030-4026Article

Applications of modern microdiffraction to materials scienceCARPENTER, R. W; SPENCE, J. C. H.Journal of microscopy (Print). 1984, Vol 136, Num 2, pp 165-178, issn 0022-2720Article

Reconstruction of complex single-particle images using charge-flipping algorithmWU, J. S; SPENCE, J. C. H.Acta crystallographica. Section A, Foundations of crystallography. 2005, Vol 61, pp 194-200, issn 0108-7673, 7 p., 2Article

Kinematic and dynamical CBED for solving thin organic films at low temperature; experimental tests with anthraceneWU, J. S; SPENCE, J. C. H.Acta crystallographica. Section A, Foundations of crystallography. 2002, Vol 58, pp 580-589, issn 0108-7673, 10 p., 6Article

Reflection electron microscope imaging of an operating scanning tunneling microscopeKUWABARA, M; LO, W; SPENCE, J. C. H et al.Journal of vacuum science and technology. A. Vacuum, surfaces, and films. 1989, Vol 7, Num 4, pp 2745-2751, issn 0734-2101, 7 p.Article

Large dynamic range, parallel detection system for electron diffraction and imagingSPENCE, J. C. H; ZUO, J. M.Review of scientific instruments. 1988, Vol 59, Num 9, pp 2102-2105, issn 0034-6748Article

Structure and bonding in α-copper phthalocyanine by electron diffractionWU, J. S; SPENCE, J. C. H.Acta crystallographica. Section A, Foundations of crystallography. 2003, Vol 59, pp 495-505, issn 0108-7673, 11 p., 5Article

Synchrotron soft X-ray and field-emission electron sources: a comparisonSPENCE, J. C. H; HOWELLS, M. R.Ultramicroscopy. 2002, Vol 93, Num 3-4, pp 213-222, issn 0304-3991, 10 p.Article

Pendellösung radiation and coherent BremsstrahlungSPENCE, J. C. H; REESE, G.Acta crystallographica. Section A, Foundations of crystallography. 1986, Vol 42, Num 6, pp 577-585, issn 0108-7673Article

Electron diffraction of thin-film pentaceneWU, J. S; SPENCE, J. C. H.Journal of applied crystallography. 2004, Vol 37, pp 78-81, issn 0021-8898, 4 p., 1Article

Core-hole effects on the B K edge in MgB₂JIANG, B; JIANG, N; SPENCE, J. C. H et al.Journal of physics. Condensed matter (Print). 2003, Vol 15, Num 8, pp 1299-1304, issn 0953-8984, 6 p.Article

Transmission-electron Fourier imaging of crystal lattices using low-voltage field-emission sources : theorySPENCE, J. C. H; QIAN, W.Physical review. B, Condensed matter. 1992, Vol 45, Num 18, pp 10271-10279, issn 0163-1829Article

Magnetic constrast in reflection electron microscopyWANG, Z. L; SPENCE, J. C. H.Surface science. 1990, Vol 234, Num 1-2, pp 98-107, issn 0039-6028, 10 p.Article

On the Holz contribution to STEM lattice images formed using high-angle dark-field detectorsSPENCE, J. C. H; ZUO, J. M; LYNCH, J et al.Ultramicroscopy. 1989, Vol 31, Num 2, pp 233-239, issn 0304-3991Article

Scanning system for high-energy electron diffractometryAVILOV, A. S; KULIGIN, A. K; PIETSCH, U et al.Journal of applied crystallography. 1999, Vol 32, pp 1033-1038, issn 0021-8898, 6Article

Dynamic inversion by the method of generalized projectionsSPENCE, J. C. H; CALEF, B; ZUO, J. M et al.Acta crystallographica. Section A, Foundations of crystallography. 1999, Vol 55, Num 2, pp 112-118, issn 0108-7673, 1Article

Atomistics and mechanical properties of siliconSPENCE, J. C. H.Acta materialia. 1999, Vol 47, Num 15-16, pp 4153-4159, issn 1359-6454Conference Paper

Ab-initio LDA calculations of the mean Coulomb potential V₀ in slabs of crystalline Si, Ge and MgOKIM, M. Y; ZUO, J. M; SPENCE, J. C. H et al.Physica status solidi. A. Applied research. 1998, Vol 166, Num 1, pp 445-451, issn 0031-8965Article